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EDGE737

EDGE737 DataSheet Per-Pin Precision Measurement Unit

Per-Pin Precision Measurement Unit

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---Full Text Search Engine--- EDGE737
---Full Text Search Engine--- Per-Pin Precision Measurement Unit

EVM737ATF EDGE737 EDGE737 E737ATF

Edge737 Per-Pin Precision Measurement Unit
TEST AND MEASUREMENT PRODUCTS Description
The Edge737 is a precision measurement unit designed for automatic test equipment and instrumentation. Manufactured in a wide voltage CMOS process, it is a monolithic solution for a per pin PMU. The Edge737 supports two modes of operation: force current/measure voltage and force voltage/measure current. The Edge737 can force or measure voltage in the range of +7V to -5V. In addition, the Edge737 can force or measure a current of up to 40 mA over four distinct ranges:  40 mA,  1 mA,  100 A and  10 A. The Edge737 has an on board window comparator that provides three bits of information: DUT too high, DUT too low, and DUT fail. There is also a monitor function which provides a real time analog voltage signal proportional to either the DUT voltage or current. On board clamps prevent large transient spikes when changing operating mode or current range. Also, the PMU will survive a direct short over the legal voltage range. The Edge737 is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per pin.
Features
* FV / MI Capability * FI / MV Capability * 4 Current Ranges ( 40 mA,  1 mA,  100 A,  10 A) * +7V / -5V I / O Range * Short Circuit Protection * Clamps for limiting mode and range select transients
Applications
* Automatic Test Equipment - Memory Testers - VLSI Testers - Mixed Signal Tester
Functional Block Diagram
HIZ
VINP FORCE IVIN
MODE SEL SENSE
I/V MAX I/V MIN DISABLE
Comparators Detector Logic Voltage Monitor
DUT LTH PASS/FAIL* DUT GTL I/V MONITOR
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Edge737
TEST AND MEASUREMENT PRODUCTS Pin Description
Pin Name VINP IVIN FORCE SENSE MODE SEL Pin # 20 21 3 2 10 Description Analog voltage input which forces the output voltage at FORCE (FV/MI mode). Analog voltage input which forces the output current at FORCE (FI/MV mode). Analog output pin which forces current or voltage. Analog input pin which senses voltage (typically connected to FORCE). Digital input which determines whether the PMU is forcing voltage or forcing current. Digital inputs which select one of the four current ranges. Analog input voltages which establish the lower and upper threshold level for the measurement comparator. Digital comparator open drain outputs that indicate the DUT measurement is less than the upper threshold and greater than the lower threshold. Digital output that indicates whether or not the monitored voltage is between the comparator thresholds. Logic1 corresponds to a measurement that is between comparator thresholds. Digital input which places the digital comparator outputs a I/V MONITOR in high impedance. Digital input which places the FORCE output into high impedance. External resistors corresponding to ranges A through D. Analog voltage output that provides a real time monitor of either the measured voltage or measured current level. External compensation pins that require an external capacitor connected between the two pins. Positive analog power supply. Negative analog power supply. External compensation pins that require an external capacitor connected between the two pins. External compensation pins that require an external capacitor connected to ground. Ground.
RS1, RS2 I/V MIN I/V MAX DUT LTH DUT GTL PASS/FAIL*
9, 11 24 31 32 26 25
DISABLE
18
HiZ RA, RB, RC, RD I/V MONITOR COMP1 COMP2 VCC VEE CA CB CAPI
8 5, 16 19, 22 12 15 14 27 13, 30 1 23 7
GND
4
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Edge737
TEST AND MEASUREMENT PRODUCTS Pin Description (continued)
32 Pin TQFP (7 mm x 7 mm x 1.4 mm) (Top View)
CA SENSE FORCE GND RA N/C CAPI HIZ
1
25
PASS/FAIL*
DUT GTL
DUT LTH
I/V MAX
VCC
VEE
N/C
N/C
I/V MIN CB RD IVIN VINP RC DISABLE N/C
9
17
RS1
MODE SEL
RS2
I/V MONITOR
COMP2
3
COMP1
VEE
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RB
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Edge737
TEST AND MEASUREMENT PRODUCTS Circuit Description
Circuit Overview The Edge737 is a parametric test and measurement unit that can : * Force Voltage / Measure Current * Force Current / Measure Voltage. The Edge737 can force or measure voltage over a +7V to -5V range, and force or measure current over four distinct ranges: *  40 mA *  1 mA *  100 A *  10 A. An on board window comparator provides three-bit measurement range classification. Also, a monitor passes a real time analog signal which tracks either the DUT's current or voltage performance. Control Inputs MODE SEL is a digital input which determines whether the PMU forces voltage or current, when it is not placed in a high impedance state by the HIZ input (see Table 1). Comparator Outputs The comparator outputs DUT GTL, DUT LTH, and PASS/FAIL* are open drain outputs. When active (logical 0), they will pull to ground. When disabled (logical 1 or DISABLE = 1), they require an external pull up resistor to a positive voltage to achieve a high state. Force / Sense FORCE is an analog output which either forces a current or forces a voltage, depending on which operating mode is selected. The SENSE pin is a high impedance analog input which measures the DUT voltage input in the FI / MV operating mode. FORCE and SENSE are brought out to separate pins to allow for remote sensing. I/V MONITOR I/V MONITOR is a real time analog output which tracks the sensed parameter. I/V MONITOR functionality is described in Table 3.
Disable 1 0 0 Mode SEL X 0 1 I/V Monitor High Impedance Measured Current Measured Voltage
HIZ 1 0 0
Mode SEL X 0 1
PMU Operation High Impedance FV / MI FI / MV
Table 1. Table 3.
RS1 and RS2 are digital inputs to an analog MUX which establishes the full scale current range of the PMU. One of four current ranges can be selected by using RS1 and RS2 as shown in Table 2.
Rext Nom RA = 200K RB = 20K RC = 2K RD = 50 RS1 0 0 1 1 RS2 0 1 1 0 Current Range A: B: C: D:  10 A  100 A  1 mA  40 mA
In the FI / MV mode, the output voltage is a 1:1 mapping of the DUT voltage. In the FV / MI mode, I/V MONITOR follows the equation: I(measured) = I/V MONITOR / (4.0 * REXT). Using nominal values for the external resistors, I/V MONITOR of +8.0V corresponds to Imax and -8.0V corresponds to Imin of the selected current range.
Table 2.
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Edge737
TEST AND MEASUREMENT PRODUCTS Circuit Description (continued)
HIZ HIZ is a digital input which places the FORCE output into a high impedance state, regardless of the operating mode (forcing current or voltage.) This function allows the PMU to be connected directly to the pin electronics without an isolation relay while NOT adding any leakage current. DISABLE DISABLE is a digital input which places DUT LTH, DUT GTL, I/V MONITOR, and PASS/FAIL* into high impedance states. Force Voltage / Measure Current Mode FORCE = IVIN / (4.0 * REXT) In the FV / MI mode, VINP is a high input impedance, analog voltage input that maps directly to the voltage forced at the DUT (see Figure 1), where FORCE = VINP . A current monitor is connected in series with the Op Amp driving the FORCE voltage. This monitor generates a voltage that is proportional to the current passing through it, and its output is brought out to I/V MONITOR. The monitor's voltage may also be evaluated using the Window Comparator whose operation is in accordance with the FV/MI functional truth table (Table 6). I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for the window comparator (see Table 4). In the FV / MI mode, a maximum voltage input corresponds to at least a maximum current output. Positive current is defined as current flowing out of the PMU. with positive current is defined as current flowing out of the PMU.
IVIN +8.0V 0V -8.0V Forced Current Imax (full scale) 0 Imin (full scale)
The voltage at I/V MONITOR follows the equation: I(measured) = I/V MONITOR / (4.0 * REXT). Nominally, the external resistors (RA, RB, RC, and RD) should be chosen such that Imax * REXT = 2.0V.
Force Current / Measure Voltage Mode In the FI / MV mode, IVIN is a high input impedance, analog voltage input that is converted into a current (see Table 5) using the following relationship:
Table 5.
The resulting DUT voltage is then tested via the SENSE input by a window comparator, whose functional truth table is shown in Table 7. I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for the window comparator. In the FI / MV mode, the reference inputs translate 1:1 to SENSE level thresholds.
I/V MAX I/V MIN +8.0V 0V -8.0V
Comparator Threshold > Imax (full scale) 0 < Imin (full scale)
Table 4.
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued)
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Edge737 Functional Schematic
D* D RC RD
FV* FV C* C RB RA DISABLE D* C* B* A*
VINP
15K FV Cext HiZ B A* A B* CAPI
IVIN
FV*
FORCE
5K
40K
+
DRIVER
- -
INST. FV COMP2 D C B A
Figure 1. Edge737 Functional Schematic
+
4X FV*
6
+
COMP1
40K
+ -
1
0
70  typ. I/V MONITOR
SENSE Cext 15 K FV* FV CB Cext CA 5 K
FV* FV
-
FV
FV*
FV
FV*
1 IV_MAX
0
FV  FV/FI* = 1 FV*  FV/FI* = 0
+ -
1
DUT_LTH
0 PASS/FAIL* 1 IV_MIN
Cext COMP1, COMP2: Force amplifier compensation
+ -
0 DUT_GTL
Cext CB, CA: Current sense resistor compensation
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Edge737
Cext CAPI: Input noise filter capacitor (low pass)
Edge737
TEST AND MEASUREMENT PRODUCTS Circuit Description (continued)
TEST CONDITION X I/V MONITOR > I/V MAX I/V MONITOR < I/V MAX I/V MONITOR > I/V MIN I/V MONITOR < I/V MIN I/V MONITOR < I/V MAX and I/V MONITOR > I/V MIN
DISABLE 1 0 0 0 0 0
DUT LTH Hi Z 0 1 N/A N/A 1
DUT GTL Hi Z N/A N/A 1 0 1
I/V MONITOR Hi Z I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT
PASS / FAIL*
0 N/A N/A 0 1
Table 6. FV / MI Truth Table
TEST CONDITION X SENSE > I/V MAX SENSE < I/V MAX SENSE > I/V MIN SENSE < I/V MIN DUT < I/V MAX and DUT > I/V MIN
DISABLE 1 0 0 0 0 0
DUT LTH Hi Z 0 1 N/A N/A 1
DUT GTL Hi Z N/A N/A 1 0 1
I/V MONITOR Hi Z I/V MONITOR = SENSE I/V MONITOR = SENSE I/V MONITOR = SENSE I/V MONITOR = SENSE I/V MONITOR = SENSE
PASS / FAIL*
0 N/A N/A 0 1
Table 7. FI / MV Truth Table
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Edge737
TEST AND MEASUREMENT PRODUCTS Circuit Description (continued)
REXT Selection The Edge737 is designed for the voltage drop across RA, RB, RC, and RD to be  2V with the maximum current passing through them. However, these resistor values can be changed to support different applications. Increasing the maximum current beyond the nominal range is not recommended. However, decreasing the maximum current is allowed. Short Circuit Protection The Edge737 is designed to survive a direct short circuit to any voltage within the supply rails at the FORCE and SENSE pins. Transient Clamps The Edge737 has on-board clamps to limit the voltage and current spikes that might result from either changing the current range or changing the operating mode. Common Mode Error/Calibration In order to attain a high degree of accuracy in a typical ATE application, offset and gain errors are accounted for through software calibration. When forcing or measuring a current with the Edge737, an additional source of error, common mode error, should be accounted for. Common mode error is a measure of how the common mode voltage, VCM, at the input of the current sense amplifier affects the forced or measured current values (see Figure 2). Since this error is created by internal resistors in the current sense amplifier, it is very linear in nature. Using the common mode error and common mode linearity specifications, one can see that with a small number of calibration steps (see Applications note PMU-A1), the effect of this error can be significantly reduced.
-5V VOS@IVMON
CM Linearity
CM Error = Slope
VCM@FORCE 7V
Figure 2. Graphical Representation of Common Mode Error
Compensation Capacitors COMP1 and COMP2 are internal op amp compensation pins that require a 120 pF capacitor connected between the two pins. CAPI is an external noise compensation pin that can be used as a low pass filter to eliminate noise from the IVIN and VINP input pins through the connection of an external capacitor from CAPI to GND. The relationship between the roll-off frequency of noise filtered (in Hz) to the external capacitance (in farads) can be seen below: 1 Filter Frequency = 80,000  X CCAPI CA and CB are internal compensation pins that require a 120 pF capacitor connected between them. Power Supply Sequencing In order to help protect the Edge737 from a latch-up condition, it is important that VCC  All Input Voltages  VEE, and VCC  GND  VEE at all times.
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Edge737
TEST AND MEASUREMENT PRODUCTS Application Information
FORCE Pin Output Voltage (Positive Headroom Requirement) The maximum positive voltage that can be forced at the FORCE pin by the Edge 737 in the force voltage/measure current (FV/MI) mode and the maximum compliance voltage that can appear at the FORCE pin in the force current/measure voltage mode (FI/MV) is a function of the positive power supply (VCC), device case temperature (Tc), and selected current range. The plot in Figure 3 depicts the typical positive voltage that can appear at the FORCE pin for various power supply combinations across the specified case temperature range of the device. All plots represent the Edge 737 being used with a  2V full-scale swing across the external current sense resistors for each range.
Edge 737 FORCE Voltage Positive Headroom
8.6 VCC = 13V, VEE = -9.5V, Ranges A, B, C VCC = 13V, VEE = -9.5V, Range D
8.4
8.2
8.0
7.8 VCC = 12V, VEE = 10V, Ranges A, B, C 7.6 VCC = 12V, VEE = 10V, Range D 7.4 VCC = 11.5V, VEE = -9.5V, Ranges A, B, C
7.2
7.0 VCC = 11.5V, VEE = -9.5V, Range D 6.8
6.6 25 30 35 40 45 50 TEMPERATURE (C) 55 60 65 70 75
Figure 3. Typical Edge737 FORCE Pin Voltage vs. Case Temperature
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Edge737
TEST AND MEASUREMENT PRODUCTS Application Information (continued)
Required External Components
Choose Rext such that: Iout (low) = V+ / RPU < 1 mA, V+  VCC 120 pF V+ 120 pF * Typical Values COMP1 COMP2 CAPI 200 K RPU RPU RPU DUT LTH 20 K RB DUT GTL 2 K PASS/FAIL* RC 50  RD CA 120 pF CB VCC VEE FORCE RA
.1 F
.1 F
VCC
VEE
* Optional (see Compensation Capacitors Section) Actual decoupling capacitor values depend on the actual system environment.
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Edge737
TEST AND MEASUREMENT PRODUCTS Package Information
32 Pin TQFP Package 7 mm x 7 mm x 1.4 mm
TOP VIEW
4 D
D/2
3 e
b E 4
N / 4 TIPS 0.20 C 4X A-B D
E/2 SEE DETAIL "A"
BOTTOM VIEW
5 D1
7
D1 / 2
E1 / 2
5
7
E1
C
OO
4X
0.20
H
A-B
D
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Edge737
TEST AND MEASUREMENT PRODUCTS Package Information (continued)
DETAIL "A"
DETAIL "B"
0 MIN.
3 e/2
- 0.05 S A2 DATUM PLANE -H- 0.08 / 0.20 R. 0.25 GAUGE PLANE
b
A1
C.08 R. MIN. 0.20 MIN. L 1.00 REF.
0-7
SECTION C-C
8 PLACES 11 / 13
A
0.05
-H-
2
//
0.10 C 0.09 / 0.20
ccc -C- M SEE DETAIL "B"
;;; ;;;
9 ddd b b 1
M C A-B S
DS
WITH LEAD FINISH
0.09 / 0.16
Lead Cross Section
BASE METAL
Notes: 1. All dimensions and tolerances conform to ANSI Y14.5-1982. 2. Datum plane -H- located at mold parting line and coincident with lead, where lead exits plastic body at bottom of parting line. 3. Datums A-B and -D- to be determined at centerline between leads where leads exit plastic body at datum plane -H-. 4. To be determined at seating plane -C-. 5. Dimensions D1 and E1 do not include mold protrusion. 6. "N" is the total # of terminals. 7. These dimensions to be determined at the datum plane -H-. 8. Package top dimensions are smaller than bottom dimensions and top of package will not overhang bottom of package. 9. Dimension b does not include dambar protrusion. Allowable dambar protrusion shall be 0.08 mm total in excess of the b dimension at maximum material condition. Dambar cannot be located on the lower radius or the foot. 10. Controlling dimension: millimeter. 11. Maximum allowable die thickness to be assembled in this package family is 0.30 millimeters. 12. This outline conforms to JEDEC publication 95, registration MO-136, variations AC, AE, and AF.
JDEC Variation Dimensions in Millimeters
Sy m A A1 A2 D D1 E E1 L M N e b b1 ccc ddd 0.30 0.30 0.45 0.15 32 0.80 B SC 0.37 0.35 0.45 0.40 0.10 0.20 9 0.05 1.35 0.10 1.40 9.00 B SC 7.00 B SC 9.00 B SC 7.00 B SC 0.60 0.765 5 Lead C ount Lead P it c h Lead T hic k ness M in Nom M ax 1.60 0.15 1.45 4 7,8 4 7,8 P ac k ag e B ody W idt h P ac k ag e B ody Leng t h Not e C omment s P ac k ag e St and Off Heig ht A ir Gap P ac k ag e B ody T hic k ness
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Edge737
TEST AND MEASUREMENT PRODUCTS Recommended Operating Conditions
Parameter Positive Analog Power Supply (Relative to GND) Negative Analog Power Supply (Relative to GND) Total Analog Power Supply Case Temperature Junction Temperature Thermal Resistance of Package (Junction to Case) Symbol VCC VEE VCC - VEE TC TJ J C 14.1 Min 11.5 - 11 21 +25 Typ 12 - 10 22 Max 13 - 9.5 22.5 +75 +125 Units V V V C C  C/W
Production tested @ +12V, -10V for linearity and min/max parametric testing.
Absolute Maximum Ratings
Parameter Positive Power Supply Negative Power Supply Total Power Supply Digital Inputs Storage Temperature Junction Temperature Soldering Temperature TS TJ Symbol VCC VEE VCC - VEE Min 0 - 13.0 0 - .5 - 55 - 65 Typ Max 14.0 0 23.0 7.0 +150 +150 +260 Units V V V V C C C
Stresses above listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect device reliability.
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Edge737
TEST AND MEASUREMENT PRODUCTS DC Characteristics
Description Power Supplies Power Supply Consumption Positive Supply (no-load) Negative Supply (no-load) Positive Supply Breakdown (Note 1) Positive Supply Rejection (Note 1) Negative Supply Breakdown (Note 1) Negative Supply Rejection (Note 1) Power Supply Rejection Ratio (Note 2) VCC/VEE to FORCE 0.1 kHz 1.0 kHz 10 kHz 100 kHz VCC/VEE to I/V MONITOR 0.1 kHz 1.0 kHz 10 kHz 100 kHz (MI mode) 100 kHz (MV mode) Force Voltage / Measure Current Mode Input Voltage Range @ VINP Input Bias Current @ VINP Capacitive Loading Range @ FORCE for Stability Output Forcing Voltage Range Forcing Voltage Accuracy (@ FORCE) Offset (VINP = 0V, no load) Linearity Gain FORCE/SENSE Combined Leakage Current in HiZ Mode Compliance Current Measurement Range Range A Range B Range C Range D Current Measurement Accuracy (@ I/V MONITOR) Offset Linearity (Note 3) Gain (Note 4) Common Mode Error Common Mode Linearity I/V MONITOR Output Leakage Current in Disable Mode Capacitive Loading Range @ I/V MONITOR
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Symbol
Min
Typ
Max
Units
ICC IEE ICCB ICC IEEB IEE PSRR
3 - 11 3 0 - 55 -3
5 -5
11 -3 11 3 - 42 0
mA mA mA mA mA mA
65 60 50 20 65 60 50 1.5 15
dB dB dB dB dB dB dB dB dB
VINP IBIAS CF O R C E VF O R C E VOS FV INL FV Gain IL E A K
VEE + 4 - 0.4 0 VEE + 4.5 - 100 - 0.025 - 0.985 - 20
VCC - 4 0.4 12 VCC - 5.0 100 0.025 1.015 20
V A nF V mV % FSVR V/V nA
1
- 10 - 100 -1 - 40
10 100 1 40
A A mA mA
VOS MI INL MI Gain CM Error CM Error IL E A K CI / V M O N I T O R
14
- 400 - 0.122 3.94 - 10 - 10.5 - 150
4
400 0.122 4.06 10 10.5 150 12
mV % FSCR V/V mV/V mV nA nF
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Edge737
TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued)
Description Force Current/Measure Voltage Mode Input Voltage Range @ IVIN Input Bias Current @ IVIN Capacitive Loading Range @ FORCE for Stability Output Forcing Current Range A Range B Range C Range D Forcing Current Accuracy (@ FORCE) Offset Gain (Note 5) Linearity @ FORCE = -5V to 7V Common Mode Error Common Mode Linearity FORCE/SENSE Combined Leakage Current in HiZ Mode Compliance Voltage Range Voltage Measurement Accuracy (@ I/V MONITOR) Offset Gain Linearity (Note 3) I/V MONITOR Output Leakage Current in Disable Mode Capacitive Loading Range @ I/V MONITOR Comparator Input Voltage Range (I/V MIN, I/V MAX) Input Offset Voltage Input Bias Current (I/V MIN, I/V MAX) Output Low Level @ IOL = 1 mA (DUT LTH, DUT GTL, PASS/FAIL*) Output Leakage in DISABLED Mode Output Leakage DISABLE Input Bias Current VIN VOS IIN VOL IOH ILEAK IIN -1 -0.2 -0.2 VEE + 1 -100 -0.4 VCC - 3 100 0.4 400 1 0.2 0.2 V mV A mV A A A IVIN IBIAS CFORCE IFORCE -9.0 -0.4 +9.0 0.4 12 10 100 1 40 4 0.26 0.35 0.075 0.1 20 VCC - 5.0 100 1.015 0.025 150 12 V A nF A A mA mA % FSCR V/V % FSCR % FSCR/V %FSCR nA V mV V/V % FSVR nA nF Symbol Min Typ Max Units
-10 -100 -1 -40 IOS FI Gain FI INL ICM Error CM Error ILEAK VCOMPLIANCE VOS MV Gain MV INL ILEAK CI/V MONITOR -4 0.24 -0.35 -0.075 -0.1 -20 VEE + 4.5 -100 0.985 -0.025 -150
0.25
1
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Edge737
TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued)
Description Analog MUX (RS1, RS2) Input High Level Input Low Level Input Bias Current Other Digital Inputs Input High Level (MODE SEL, HIZ) Input Low Level (MODE SEL, HIZ) MODE SEL Input Bias Current HIZ Input Bias Current VIH VIL IIN IIN - 0.2 -1 2.4 0 .8 0.2 50 V V A A VIH VIL IIN - 0.2 2.4 0.8 0.2 V V A Symbol Min Typ Max Units
DC Test Conditions: CAPI = 120 pF connected to GND, CA - CB = 120 pF, COMP1 - COMP2 = 120 pF, TA = 25C unless otherwise noted. Note 1: Note 2: Note 3: Note 4: Test Conditions are as follows: VCC = 12 to 13V, VEE = -10V, 40 mA is externally forced into FORCE pin. Guaranteed by design and characterization. Not production tested. Characterized with a  10 A current load at I/V MONITOR. V/V units derived as follows: MI Gain = Note 5: VIVMON (IMEASURED x REXT)
V/V units derived as follows: FI Gain = IFORCE x REXT VIVIN
Unit Definitions: FSCR = Full Scale Current Range Range A, FSCR = 20 A Range B, FSCR = 200 A Range C, FSCR = 2 mA Range D, FSCR = 80 mA FSVR = Full Scale Voltage Range = 12V nominal (-5V to 7V)
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Edge737
TEST AND MEASUREMENT PRODUCTS
Description Force Voltage / Measure Current Mode FORCE Voltage Settling Time (100 pF load @ FORCE) To 0.1% of 10V Step Range A Ranges B, C, D To 0.025% of 10V Step All Ranges FORCE Amp Saturation Recovery Time Measure Current Settling Time (100 pF load @ I/V MONITOR) To 0.1% of FSCR Range A Ranges B, C, D To 0.025% of FSCR Range A Ranges B, C, D Disable Time, HiZ Low to High Enable Time, HiZ High to Low Force Current / Measure Voltage Mode FORCE Output Current Settling Time (100 pF load @ FORCE) To 0.1% of FSCR Range A Ranges B, C, D To 0.025% of FSCR Range A Ranges B, C, D FORCE Amp Saturation Recovery Time Measure Voltage Settling Time (100 pF load @ I/V MONITOR) To 0.1% of 10V Step Range A Ranges B, C, C To 0.025% of 10V Step Range A Ranges B, C, D Disable Time, HiZ Low to High Enable Time, HiZ High to Low Symbol Min Typ Max Units
tsettle 150 120 300 tsat tsettle 400 125 1.5 300 tz toe 1 450 s s ms s s ns 35 s s s s
tsettle 700 250 2 300 tsat tsettle 700 250 2 350 tz toe 1 0.45 s s ms s s s 35 s s ms s s
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Edge737
TEST AND MEASUREMENT PRODUCTS AC Characteristics
Description Comparator Propagation Delay Disable Time, DISABLE Low to High Enable Time, DISABLE High to Low I/V MONITOR Disable Time, DISABLE Low to High Enable Time, DISABLE High to Low Mode/Range Selection MODE SEL Propagation Delay RS0/RS1 Propagation Delay tp d tp d 10 1 s s tz to e 350 40 ns s tp d tz to e 30 300 5.5 s ns s Symbol Min Typ Max Units
AC Test Conditions: CAPI = 120 pF connected to GND, CA - CB = 120 pF, COMP1 - COMP2 = 120 pF, TA = 25C unless otherwise noted. Settling times guaranteed by design and characterization (not production tested).
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Edge737
TEST AND MEASUREMENT PRODUCTS Ordering Information
Model Number
Package 32-Pin TQFP 7 mm x 7 mm Edge737H Evaluation Module
E737ATF
EVM737ATF
This device is ESD sensitive. Care should be taken when handling and installing this device to avoid damaging it.
Contact Information
Semtech Corporation Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633
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